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National Standards|Association for Electrical Engineering, Power and Information Technologies

  • SN EN 60749-20

    SN EN 60749-20
    Art.No.: 100552162
    Edition: 2009-11 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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  • SN EN 60749-20-1

    SN EN 60749-20-1
    Art.No.: 100551530
    Edition: 2009-06 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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  • SN EN 60749-21

    SN EN 60749-21
    Art.No.: 100554710
    Edition: 2011-08 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

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  • SN EN 60749-26

    SN EN 60749-26
    Art.No.: 100558386
    Edition: 2014-05 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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  • SN EN 60749-29

    SN EN 60749-29
    Art.No.: 100554714
    Edition: 2011-08 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

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  • SN EN 60749-30+A1

    SN EN 60749-30+A1
    Art.No.: 100555163
    Edition: 2011-07 | Standard | Approved

    Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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  • SN EN 60749-35

    SN EN 60749-35
    Art.No.: 100548631
    Edition: 2006-09 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods. Part 35: Acoustic microscopy for plastic encapsulated electronic components

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  • SN EN 60749-36

    SN/Electrosuisse
    Art.No.: 100546787
    Edition: 2003-04 | Standard | Approved

    Semiconductor devices - Mechanical and climatic test methods. Part 36: Acceleration, steady state

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  • SN EN 60749-37

    SN EN 60749-37
    Art.No.: 100549954
    Edition: 2008-04 | Endorsement notice | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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  • SN EN 60749-38

    SN EN 60749-38
    Art.No.: 100550120
    Edition: 2008-05 | Endorsement notice | Approved

    Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

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